Device for Rapid Orientation of Crystals by Direct-Image X-Ray Techniques

摘要

A device has been designed, built and tested which facilitates the rapid orientation of crystals by direct inspection of an electronically intensified optical image of their Laue patterns. Remote controls permit the rotation of the sample about two axes during the X-ray exposure. The pattern can also be recorded on fast Polaroid film. The operating characteristics of the device are described.