Transmission Electron Microscopy of Thin Glass Samples

摘要

Two techniques for preparing thin glass samples for direct transmission electron microscopy, viz. mechanical thinning and fracturing are discussed. A modification of the Doherty and Leombruno procedure for mechanically thinning ceramic materials is described. These techniques make possible more reliable electron microscope studies of fine scale submicrostructure in glass systems. Electron microscope observations on fused silica, an alkali-borosilicate glass, and some binary silicate glasses are reported and discussed in terms of our present understanding of glass structure. (Author)