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Anhysteretic Magnetization and Flux Reversal in Tape Cores, and an Analog Core Memory

机译:磁芯中的非磁滞磁化和磁通反转,以及模拟核心存储器

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The low speed switching mechanism for 50% nickel-iron tape cores is investigated by several experimental procedures. These include finding the high-field response of a core partially switched by a low field, recording the partial hysteresis loop starting from a remanence established by fields of various magnitudes, and switching with low field a core which has been only partially reversed by a high field. Anhysteretic magnetization curves are obtained, and they are related to core geometry. A general summary of switching models for all ranges of switching is presented; from this and the data it is possible to conclude a lower bound on the energy of a 180 degrees domain wall in the tape. An analog memory device is presented and described. This is based upon the concepts of flux reversal presented in this and earlier works. (Author)

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