Low-Power Explosion of Thin-Film Resistors.

摘要

An equation is derived that may be used in conjunction with experimental power measurements to determine the temperature at which a thin-film resistor is burned out. The objective of the analysis is to provide information that may be used to assist in the design of an inexpensive, match-like detonator activated by the heat generated in a thin-film resistor pulsed by a capacitor discharge system. (Author)