Initial Study for the Development of a Reliability-Prediction Technique for Monolithic Integrated Circuits

摘要

The report presents the results of a study to determine the feasibility of developing a reliability-prediction technique for integrated circuits. The proposed prediction technique is intended to be based upon statistical analysis of data collected from manufacturers and users of integrated circuits. The principal aim of the study described here was to determine whether the proposed prediction technique can be supported by the integrated-circuit reliability data that have been recorded and retained by organizations involved in integrated-circuit applications. A list of the significant reliability-influencing variables was prepared and the feasibility of developing prediction equations based on a regression analysis of these variables from the data available has been established. (Author)