Studies, Research and Investigations of the Optical Properties of Thin Films of Metals, Semi-Conductors and Dielectrics

摘要

The effect of small variations in the measured values of reflectance and transmittance on the optical constants was studied for several cases. The optical constants were determined by the measurement of reflectivity and transmissivity as a function of wavelength, and by measuring the thickness. The previously calculated curves relating these parameters were then used. The primary emphasis in this report lies in an attempt to assess the limits of validity in the use of this method of determining optical constants. To this end, some measurements were also made on chromium films. (Author)