The Use of an X-Ray Source in the Optical Spectroscopy of Rare Earth Doped Ionic Materials

摘要

The report presents the results of a study of the luminescence of rare earth doped ionic materials. The first part discusses the application of X-ray-stimulated luminescence to the detection of trivalent rare earth impurities. Characteristic luminescent wavelengths allow the identification of individual rare earths. The application of the technique to the assessment of single crystals and the appropriate starting material is discussed. The second part considers the advantages offered by the use of an X-ray source as a pumping source in optical spectroscopy. The examples given to illustrate these advantages cover the appraisal of poor quality material, and the enhancement of one emission with respect to another. (Author)