Spectral and Polarization Characteristics of Selected Targets and Backgrounds: Instrumentation and Measured Results (3.3-14.0 micrometers)

摘要

Spectral, polarization, and view-angle dependent characteristics of 3.3-14.0 micrometers radiance have been measured for a number of target and background materials. Emittances have been measured in the laboratory and radiances measured in the field. Significant characteristics have been found to exist in these data which allow for improved target/background discrimination for reconnaissance and weapon delivery. The instrumentation built to collect these data and its principles of operation are described, and collected data are presented. The angular-dependent spectral and polarized emittance type data measured in the laboratory were unavailable prior to this measurement program. The data are used to show how spectral and polarization characteristics in the infrared provide a substantially improved capability of discriminating targets from backgrounds in real environments. (Author)