A Time-Resolved Ross Filter System for Measuring X-Ray Spectra in Z-Pinch Plasma Focus Devices.

摘要

The development of plasma pinch and other flash x-ray devices has created the need for a system capable of measuring the spectra of 50-nsec x-ray pulses. A Ross filter system used in conjunction with silicon diode x-ray detectors gives nanosecond time resolution in spectral intervals between 5.46and 115.6keV. (Author)