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Study,Investigation and Development of Non-Destructive Reliability Screening of Metallized Mylar Capacitors.

机译:金属化聚酯薄膜电容器无损可靠性筛选的研究,调查与发展。

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The purpose of the program was to study,investigate and develop non-destructive techniques for the reliability screening of metallized mylar capacitors that are potential failures,from a lot of high quality production parts. (Author)

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