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Characterization of Particulate Ceramic Materials by Computerized Scanning Electron Microscope Techniques

机译:用计算机扫描电子显微镜技术表征颗粒陶瓷材料

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Techniques have been developed for the quantitative characterization of particulate materials by computer evaluation of scanning electron microscope images (CESEMI). The full CESEMI analysis is particularily applicable to particles in the size range of 0.1 to 100 micrometers diameter. It measures, particle-by-particle, the following basic parameters: Project areas; Perimeter; Major axis of fitted ellipse; Minor axis of fitted ellipse; Orientation of major axis; and Particle type as deduced from characteristic x-ray signals for the elements. The technique is not described in detail here. On the other hand, the simple image analysis procedures have been only recently developed and are described in detail. (Author)

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