Photocurrent Spectroscopy in Thin Film Insulators:Voltage Dependence of the External Circuit Current,

摘要

An analytical model for trapping state photodepopulation measurements in conductor-thin film insulator-conductor structures is presented. The external circuit current dependence on applied voltage is determined, and it is shown that moments of the spatial distribution of trapped charge in the insulator can be extracted from collected charge vs. applied field characteristic curves. The photodepopulation technique is compared with more widely used differential capacitance and photoemission current techniques.