Unipolar Current Transport through Metal-Insulator-Metal (MIM) Structures, Supplied with Barrier Contacts, in the Diffusion Limit.

摘要

The diffusion-limited unipolar current density-voltage (j-V) dependencies through semi-insulating materials supplied with two barrier contacts have been computed. Two cases are treated. In the first, the sum of the two quiescent barrier thicknesses is less than the specimen thickness. In the second case, the sum of the two quiescent barrier thicknesses exceeds the specimen thickness.