Failure Mechanisms in Irradiated Plastic Integrated Circuits.

摘要

The program was devised to evaluate the performance of plastic integrated circuits in various types of radiation environments. Two different test parts were employed. These parts were selected to be representative of broad semiconductor processing technologies. The bipolar process technology was represented by 741operational amplifier. The complementary metal-oxide-silicon (CMOS) process was represented by the 4028binary-to-decimal decoder. (Modified author abstract)