Penetration of Cadmium into Nylon Separators of Ni-Cd Batteries,

摘要

Because of the preflight occurrence of failure resulting from a short circuit between plates and extensive cadmium migration to the separators of a Ni-Cd cell intended for long-term use in a satellite, a series of photomicrographic investigations has been made of the depth of cadmium penetration into a separator from the cell and related cells. Electron probe and ion probe studies were also conducted. It was found that cadmium penetrations as deep as 80% occurred,and,in many instances, a depth of more than 30% of separator penetration was observed. Since cell failure and battery performance losses can be caused by 100% penetration depths of cadmium,the results of the investigation indicate that cadmium migration and penetration into the separators of this set of Ni-Cd cells constitute a serious problem with respect to meeting the power-storage lifetime requirements of the electrical system for the satellite. (Author)