Quantitative Sem and Raster Profilometer Analysis of Fracture Surfaces.

摘要

The problem of being able to obtain raster profilometer traces and SEM image recording from identical fracture areas has been solved. Both types of image are now being processed by the same CESEMI computer programs for purposes of mapping of data and for quantitative enumeration of surface characteristics. The raster profilometer data tend to measure the actual long-range surface elevational detail,while the SEM images tend to bring out details of short-range surface roughness. It appears to be feasible,in the long run,to obtain SEM data comparable to raster profilometer,but this will definitely involve the use of multiple detector arrangements at the least. The derivative-signal processed images are particularly useful in viewing fracture surface detail,and it is anticipated that considerable use will be made of this kind of image detail in the future. (Author)