Automation of Data Collection for Lubricated Component Life-Cycle Testing.

摘要

A microprocessor system produced by Control Logic, Inc. and called the M Series Developmental System was configured to acquire and reduce data from an experimental test stand. The controlling program for the processor system was written in the PL/M language. The function of the system is to partially reduce data from the test stand and store the data on magnetic tape if specified requirements are met. The functions and interconnections of the system's individual modules are described in detail and the source documents for their specifications are identified.