Impulse Noise Generators and Testing of Modems.

摘要

The report presents results on the hardware implementations and testing of the impulse noise generators described in an earlier RADC technical report. The Prototype impulse noise generator consists of two separate units. Samples from the lognormal distribution are generated in one unit. Since the lognormal amplitude distribution is a frequently used model for impulse noise in wireline, this unit can be used directly to simulate the wireline impulse noise. The second unit generates the pseudorandom background noise and burst timing signals and can be used to simulate various burst impulse noise present in wideband communication systems. The noise generators are all implemented using standard TTL integrated circuits. Results are also presented on using the hardware impulse noise generators to test a number of modems operating at the 4800 bps rate. Measured results show the effect of burst impulse noise with different parameters on the bit-error-rate (BER) and on the throughput of the modems tested.