Reliability Evaluation of C/MOS Technology in Complex Integrated Circuits.

摘要

The objective of the study was to investigate reliability of small and medium scale C/MOS integrated circuits. Four manufacturers type 4011A Quad 2-input NAND Gates and three manufacturers type 4015A dual four stage static shift registers were chosen as test vehicles. The study evaluated the effects of burn-ins and environmental stresses on the devices reliability. An evaluation was also made of the input protection networks and a possible screen for input protection network was established. 993 gate devices and 148 shift register devices were tested.