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Transmission Electron Microscopy Study of Subgrain Strengthening of Cartridge Brass.

机译:筒形黄铜亚晶强化的透射电子显微镜研究。

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摘要

The development of substructure in cartridge brass, subjected to cold rolling followed by warm annealing, is characterized as a function of annealing temperature and true strain. Substructure develops and becomes refined as annealing temperature is increased to the point of recrystallization. Dislocation cell structure is also refined as true strain is increased. The variation of hardness with annealing temperature correlates well with substructure development and refinement.

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