General Test Plan, Pulsed Voltage Failure Levels of Capacitors

摘要

The test plan of this program is to determine (1) pulsed voltage/power failure levels and (2) failure mechanisms for selected capacitors typical of those used in military electronic systems. The pulsed voltage/power levels of concern are those levels, with some safety margin, that could be induced in electronic components by electromagnetic pulse from nuclear weapons. Sufficient failure data are to be obtained so that device failure predictions are typical for each device; although statistical data collection is not required. (Author)