Computerized Pattern Recognition Applied to Ni-Cd Cell Lifetime Prediction.

摘要

Computerized pattern recognition was used to look for characteristics of new nickel-cadmium spacecraft cells which would be predictive of later performance under stressful conditions. It was found that the changes in voltage while a cell was being charged could be used to make a rough estimate of its lifetime. The standard deviation in the predicted lifetime values was somewhat smaller than the standard deviation of the lifetime distribution as a whole, and there are indications that a more extensive data set would yield better results. (Author)