Characterization of Microprocessors and Microprocessor Support Chips.

摘要

The objective of this effort was to develop high test confidence level functional tests and parametric tests for selected microprocessors and microprocessor support devices; and then generate MIL-M-38510 slash sheets for them which conformed to military standards. This included worst case test situations, critical timing and generation of new test procedures where present or accepted methods no longer apply. Devices characterized were the 1802 CMOS microprocessor, 8228/38 system controller and bus driver, 8224 clock generator and driver and 6821 peripheral interface adapter. (Author)