Soft X-Ray Photoemission: Development of User Oriented Code SXRP and Its Application to Photoemission, Electron Backscatter, Charge Deposition and Energy Deposition

摘要

This work is a continuation of our program to characterize soft X-ray photoemission for various materials used in space systems. The code SXRP is developed specifically to achieve this goal. Results predicted by this code for X-ray line sources are compared with measurements in this report. General agreement is found between theory and experiments. To assist SGEMP analysts in modeling the electromagnetic environment of systems exposed to soft X-ray in simulation test, a user-oriented algorithm for choosing transport energy grid is successfully developed for code SXRP. Electron backscatter of Al and Au are investigated to further test the scattering model in code SXRP. Another investigation concerned charge and energy deposition in Teflon for incident soft electron sources. Both investigations demonstrate the capability of SXRP to treat external electron as well as X-ray sources. (Author)