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Low-Energy Electron Diffraction Beam Shapes and Fluctuation Phenomena Near an Order-Disorder Transition

机译：低阶电子衍射光束形状和有序 - 无序转换附近的波动现象

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Lu, T. M.; Zhao, L. H.; Lagally, M. G.;
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年度 1980
页码 p.1-4
总页数 4
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
Chemisorption; Order disorder transformations; Surface properties; Electron diffraction; Low energy; Beam forming; Variations; Reprints;

机译：化学吸附;有序无序转换;表面特性;电子衍射;低能量;波束形成;变化;重印;

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3. Structure determination of Si(001)-c(4X2) surfaces at 80 K and electron beam effect below 40 K studied by low-energy electron diffraction [J] . Seigi Mizuno, Tetsuroh Shirasawa, Yuichiro Shiraishi, Physical review. B, Condensed Matter And Materals Physics . 2004,第24期

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5. Silicon surface phase transition studies using low-energy electron microscopy and diffraction. [D] . Maxson, Jeffery Burton. 2001

机译：硅表面相变研究使用低能电子显微镜和衍射进行。
6. High-resolution study of dynamical diffraction phenomena accompanying the Renninger (222/113) case of three-beam diffraction in silicon [O] . A. Kazimirov, V. G. Kohn -1

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7. Reliability of low-energy electron diffraction for studies of surface order-disorder phenomena [O] . Moritz Wolfgang, Lagally Max G. 1986

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Low-Energy Electron Diffraction Beam Shapes and Fluctuation Phenomena Near an Order-Disorder Transition

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