Reliability Evaluation of Plastic Encapsulated Hybrid Microcircuits Developed for Army Fuze Applications

摘要

A major Army rocket system may incorporate the use of an electronic fuze timer fabricated using two plastic encapsulated hybrid microcircuits and one encapsulated monolithic integrated circuit. The Electronics Technology and Devices Laboratory at Fort Monmouth, New Jersey was tasked with assessing the storage reliability of these devices through accelerated testing and detailed failure analysis to determine failure mechanisms. From this analysis, corrective actions would be proposed which could permit attainment of the desired reliability. (Author)