An Objective Printed Circuit Board Testability Design Guide and Rating System

摘要

A methodology was developed during this study that accurately evaluates the testability merits of a printed circuit board (PCB). This is accomplished through a 'Figure of Merit' rating system that weighs the 'difficult to test' and 'easy to test' aspects of a circuit design. The principal output of this study is an extensive Testability Design Guide that describes how testability problems associated with circuit structure can be corrected. The Design Guide works hand-in-hand with the rating system, such that the rating system identifies the nature and extent of the current testability problem and the guide provides the means to correct the design deficiencies. The developed guide and evaluation procedures were demonstrated on a number of 'difficult to test' PCBs which resulted in much improved fault isolation and significantly reduced times. (Author)