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Design, Test, and Comparative Analysis of Programmable Interface Unit Circuit Configurations.

机译:可编程接口单元电路配置的设计,测试和比较分析。

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This report documents the results of analytic calculations and laboratory testing performed on three proposed configurations to solve power transistor overheating in the programmable interface unit (PIU) of the Hybrid Automatic Test Station (HATS). Recommendations are made regarding the most effective configuration in terms of cost and performance. (Author)

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