首页> 美国政府科技报告 >State-of-the-Art Assessment of Testing and Testability of Custom LSI (Large Scale Integration)/VLSI (Very Large Scale Integration) Circuits. Volume VI. Redundancy, Testing Circuits, and Codes
【24h】

State-of-the-Art Assessment of Testing and Testability of Custom LSI (Large Scale Integration)/VLSI (Very Large Scale Integration) Circuits. Volume VI. Redundancy, Testing Circuits, and Codes

机译:定制LsI(大规模集成)/ VLsI(超大规模集成电路)测试和可测试性的最新评估。第六卷。冗余,测试电路和代码

获取原文

摘要

The demands for higher system reliability and self checking required by the new fault tolerant computers have put new emphais on the use of the redundant circuits. Types of redundancy include parallel, triple modular redundancy, Quadd, standby, hybrid and software. Various computers employing one or more of these types are discussed. Generally, hardware, software and time redundancy required for error detection and correltion, are interrelated. Mathematical modleing, when applied to fault tolerant systems, can be used to measure the system reliability.

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号