Storage Reliability Analysis Summary Report. Volume V. Optical and Electro-Optical Devices

摘要

This document summarizes storage reliability data collected by the US Army Missile Command on optical and electro-optical devices over a period of several years. Sources of data are detailed, major failure modes and mechanisms are listed and discussed. Non-operational failure rate prediction methodology is given, and conclusions and recommendations for enhancing the storage reliability of devices are drawn from the analysis of the collected data. (Author)