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New Algorithms for Testing Instruction Decoding Function of Microprocessors

机译:微处理器指令译码功能测试的新算法

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This paper presents three algorithms to test the instruction decoding function of microprocessors. The algorithms are based on the knowledge of some timing and control information available to users through microprocessor manuals and data sheets. The tests are functional in nature. The authors establish the order of complexity of the algorithms presented in this paper. As an example, the test complexity for a microprocessor is computed and the results are compared with a known algorithm.

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