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Developing Double Sampling Plans for Attributes to Meet Sample Size Criteria.

机译:开发属性的双采样计划以满足样本大小标准。

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This study reports on the development of a FORTRAN IV program to produce double sampling acceptance plans for attributes data. The plans must satisfy two points on an operating characteristic curve, the acceptable quality level point (p1, 1-alpha) and the rejectable quality level (p2, beta). Two models are given. Model I has an additional constraint that the maximum value of the ASN must be less than or equal to the sample size for a corresponding single sampling plan. Model II relieves this constraint. In either case, the resulting plan has a minimum ASN evaluated at the quality level p1 among all sampling plans satisfying the constraints. (Author)

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