Quantum Indecision in Logic Gates

摘要

Logic gates in very large-scale integrated circuits typically employ standard variations of field-effect transistors (FET). In micro circuits, dimensions of such devices are of the order of 1 micron. Current technology seeks to further reduce the scale-length of micro-computer networks. Thus, the present work examines limitations imposed on the reliability of such logic gates due to quantum uncertainty which enters in the limit of small dimensions.