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Acquire an Bruker Dimension FastScanTM Atomic Force Microscope (AFM) for Materials, Physical and Biological Science Research and Education.

机译：收购用于材料，物理和生物科学研究和教育的Bruker Dimension FastscanTm原子力显微镜（aFm）。

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作者
Khan, I.;
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年度 2016
页码 1-16
总页数 16
原文格式 PDF
正文语种 eng
中图分类
关键词
Self assembly; Afm(atomic force microscope); Suprastructures; Polymeric hairy nanoparticles;

机译：自组装; afm（原子力显微镜）;超结构;聚合毛状纳米颗粒;

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专利

1. Atomic Force Microscope(afm) In Chemistry, Biology And material Science [J] . Sipra Choudhury Material science foundations . 2009,第期

机译：化学，生物学和材料科学领域的原子力显微镜
2. Atomic Force Microscope (afm) In Chemistry, Biology And material Science [J] . Sipra Choudhury Material science foundations . 2008,第期

机译：化学，生物学和材料科学领域的原子力显微镜（AFM）
3. Atomic force microscope (AFM) combined with the ultramicrotome: a novel device for the serial section tomography and AFM/TEM complementary structural analysis of biological and polymer samples [J] . EFIMOV ANTON E, TONEVITSKY ALEXANDER G, DITTRICH MARIA, Journal of Microscopy . 2007,第Pta3期

机译：原子力显微镜（AFM）与超薄切片机相结合：一种用于生物和聚合物样品的串行截面层析成像和AFM / TEM互补结构分析的新型设备
4. Critical-dimension atomic force microscope (CD-AFM) measurement of masks [C] . Sylvain Muckenhirn, Veeco Process Metrology, Santa Barbara, Conference on metrology, inspection, and process control for microlithography . 1998

机译：口罩的临界尺寸原子力显微镜（CD-AFM）测量
5. Biological materials investigation by atomic force microscope (AFM). [D] . Agarwal, Ankita. 2002

机译：通过原子力显微镜（AFM）研究生物材料。
6. A new esthetic fiber-reinforced polymer composite resin archwire: a comparative atomic force microscope (AFM) and field-emission scanning electron microscope (FESEM) study [O] . Chai Kiat Chng, Kelvin Foong, Narayan H Gandedkar, 2014

机译：新型美学纤维增强聚合物复合树脂弓丝：比较原子力显微镜（AFM）和场发射扫描电子显微镜（FESEM）的研究
7. High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (nc AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy [O] . Oral, A., Grimble, R. A., Ozer, H. O., 2003

机译：高灵敏度非接触原子力显微镜/扫描隧道显微镜（nc AFM / STM），工作于亚埃振荡振幅，用于原子分辨率成像和力谱

Acquire an Bruker Dimension FastScanTM Atomic Force Microscope (AFM) for Materials, Physical and Biological Science Research and Education.

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