Collection of Preprints and Reprints

摘要

Contents: Calculation of the Coverage Parameter for the Reliability Modeling of Fault-Tolerant Computer Systems; Properties of Transient Errors Due to Power Supply Disturbances; Concurrent Built-In Logic Block Observer (CBILBO); Modeling Power-Supply Disturbances in Digital Circuits; and Design of CMOS VLSI Circuits for Testability.