Method for Long Term Ionizing Radiation Damage Predictions for the Space Environment

摘要

The objective of the work is to predict the total dose damage from low level ionizing radiation sources for very long (5 years) exposure times. A prior effort to extrapolate annealing data to long times used linear systems theory or the convolution integral. Problems with the linear systems theory approach are: the damage is assumed to be linear even though the experimental data show a saturation effect; the annealing function, which is to be combined with the dose rate, needs to be known for a very long length of time (i.e., a 5-year observation of the annealing); and to do the integral numerically using data requires large amounts of computation. Keywords: Microelectronics, Radiation effects, Hardness assurance, Oxide charge, Surface effects, Total dose effects. (JES)