Depolarization and Backscatter Enhancement in Light Scattering from Random Rough Surfaces: Comparison of Full-Wave Theory with Experiment.

摘要

The full-wave approach is used to interpret the recently observed depolarization and enhanced backscattering of light from random rough surfaces fabricated in photoresist with an aluminum overcoating. A second-order iterative solution based on the rigorous full-wave approach indicates that, contrary to previous suggestions, the observed enhanced backscatter is a first-order effect that can be attributed to single scatter rather than to multiple scatter. Reprints. (JHD)