Artifact Filter for Event-Related Potentials.

摘要

Scalp-surface recordings of event-related potentials (ERPs) are frequently contaminated by electrical artifacts. We describe a Fortran 77 computer program that examines ERP data for several types of electrical artifacts: eyeblinks, voltages spikes, large local voltages, large overall voltages, amplifier saturation effects, and dead-amplifier effects. Where possible, the program compensates the ERP data for electrooculogram artifacts by time-domain cross-regression procedures. Keywords: Performance assessment, Event-related potentials, Evoked potentials, Psychophysiology, ERP, Artifact detection, EEG, EOG, Eyeblinks, Voltage spikes, Absolute voltages, Root-mean-square voltages, RMS, Amplifier clipping, Saturation, Artifacts, Biomedical instrumentation. (JG)