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Probing Interfacial Structure and Composition with X-Ray Standing Waves.

机译:用X射线驻波探测界面结构和成分。

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A brief description is given for the principles of x-ray standing waves based on Bragg diffraction and total external reflection. The broad range applicability of this technique to probe interfacial structure and composition is illustrated by considering representative examples from the areas of adsorbate structures in ultra-high vacuum, potential dependent changes in an electrochemical systems and the study of ionic distributions at a model membrane. Keywords: X rays; Synchrotron radiation; Standing waves; Interfaces. (jhd)

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