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Image Analysis Program for Measuring Particles with the Zeiss CSM 950 ScanningElectron Microscope (SEM)

机译：使用Zeiss Csm 950扫描电子显微镜（sEm）测量颗粒的图像分析程序

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A menu-type computer program for stereological particle measurement was writtenfor use with a Zeiss CSM 950 Scanning Electron Microscope (SEM) having a built-in Kontron image analyzer. The program enables the user to perform a variety of parameter measurements from external sources such as a light microscope or video camera. Carbon particles measurement; Spheres; Computer programs/menu. Statistical analysis. (edc)

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作者
Sakelakos, D.; Cohen, S. H.; King, A.;
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年度 1990
页码
总页数 39
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
Image processing; Scanning electron microscopes; Analyzers; Cameras; Carbon; Computer programs; External; Images; Light; Measurement; Menu; Parameters; Particles; Sources; Spheres; Statistical analysis; Video signals;

机译：图像处理;扫描电子显微镜;分析仪;相机;碳;计算机程序;外部;图像;光;测量;菜单;参数;粒子;光源;球体;统计分析;视频信号;

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专利

1. Description of Ore Particles from X-Ray Microtomography (XMT) Images, Supported by Scanning Electron Microscope (SEM)-Based Image Analysis [J] . Furat Orkun, Leissner Thomas, Ditscherlein Ralf, Microscopy and microanalysis: The official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada . 2018,第5期

机译：来自X射线显微镜（XMT）图像的矿石颗粒的描述，通过扫描电子显微镜（SEM）基于图像分析
2. An application of automatic particle height measuring technique using laser diodes to the measurement of pulverized particle coal distribution under an image analysis system with an optical microscope [J] . Takayuki Sugita, Yoshifumi Kitayama, Fujio Johkoh 計測自動制御学会論文集 . 2001,第5期

机译：激光二极管自动颗粒高度测量技术在光学显微镜图像分析系统中粉煤分布分布测量中的应用
3. An application of automatic particle height measuring technique using laser diodes to the measurement of pulverized particle coal distribution under an image analysis system with an optical microscope [J] . Takayuki Sugita, Yoshifumi Kitayama, Fujio Johkoh 計測自動制御学会論文集 . 2001,第5期

机译：用光学显微镜将激光二极管使用激光二极管对粉碎粒煤分布测量的应用
4. Characterisation of Pigment particles by Scanning Electron Microscope and Image Analysis Programs [C] . M. Linnala, S. Turunen, A-L. Makela International Workshop on Industrial Crystallization . 2009

机译：通过扫描电子显微镜和图像分析计划表征颜料颗粒
5. Scanning Electron Microscope (SEM) images as a means to determine dispersibility [D] . Velasco, Erica Susan. 2013

机译：扫描电子显微镜（SEM）图像作为确定分散性的一种手段
6. A quantitative method to measure biofilm removal efficiency from complex biomaterial surfaces using SEM and image analysis [O] . N. Vyas, R. L. Sammons, O. Addison, -1

机译：使用SEM和图像分析测量复杂生物材料表面生物膜去除效率的定量方法
7. Figure 3: The images of Acanthopagrus schlegelii (A) and Halichoeres nigrescens (B) eggs; the chosen fish eggs were initially photographed using Zeiss microscope (Axioplan 2 imaging E). [O] . -1

机译：图3：acanthopagrus schlegelii（a）和halichoeres nigrescens（b）鸡蛋的图像;最初使用Zeiss显微镜（Axioplan 2成像E）拍摄所选择的鱼卵。

Image Analysis Program for Measuring Particles with the Zeiss CSM 950 ScanningElectron Microscope (SEM)

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