Bias-Lead Monitoring of Ultrafast Nonlinearities in InGaAsP Diode Laser Amplifiers.

摘要

In this letter we report the first femtosecond measurements of gain and loss dynamics in InGaAsP diode laser amplifiers using optically induced changes in diode junction voltage. Our results confirm that previously observed optical pump-probe signals are related to carrier dynamics in the active region of the amplifiers. Reprints. (rh)