首页> 美国政府科技报告 >Generic Linear Microcircuit Test Requirements
【24h】

Generic Linear Microcircuit Test Requirements

机译:通用线性微电路测试要求

获取原文

摘要

This is the final report for the Generic Linear Microcircuit Test RequirementsProgram performed for Rome Laboratory (formerly Rome Air Development Center). The objective of this program was to develop new series-4000 test specifications to standardize testing of linear devices. The drafts developed under contract will replace the existing series-4000 methods in MIL-STD-883C. New series-4000 drafts for 11 device families were developed, which will cover the majority of the linear microcircuits used in military systems. The test methods specified in each draft referenced a variety of sources including M38510 slash sheets, industry standard procedures, literature, existing test methods in MIL-STD-883C, and newly developed methods. Completion of these drafts will provide more consistent testing of linear devices. This report reviews all aspects of the program.

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号