Enhanced Backscattering from a Rough Dielectric Film on a Reflecting Substrate

摘要

We carry out computer simulations of the scattering of a beam of light with p ors polarization from a transparent dielectric film (BaSO4) on a perfectly conducting substrate. The dielectric vacuum interface is assumed to be a random grating; the dielectric conductor interface is assumed to be planar. It is found that for incident light of either polarization the angular dependence of the incoherent contribution to the mean intensity of the scattered light has a well-defined peak when the scattering angle corresponds to the retroreflection direction (enhanced backscattering). In recent numerical simulations of the scattering of light from random gratings that are ruled on the surface of a semi infinite, nearby transparent dielectric medium (BaSO4), it was found that incident light of p polarization did not given rise to enhanced backscattering, whereas incident light of s polarization did lead to enhanced backscattering.