Atomic Force Microscope Studies of Fullerene Films: Highly Stable C60 fcc (311)Free Surfaces

摘要

Atomic force microscopy and x-ray diffractometry were used to study 1500 A-thickfilm of pure C60 grown by sublimation in ultrahigh vacuum onto s CaF2 (111) substrate. Topographs of the films did not reveal the expected close-packed structures, but they showed instead large regions that correspond to a face-centered cubic (311) surface and distortions of this surface. The open (311) structure may have a relatively low free energy because the low packing density contributes to a high entropy of the exposed surface.