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Design of an Infrared Laboratory for Testing Seeker Components

机译:用于测试导引头组件的红外实验室设计

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A summary is given of the facilities necessary to adequately test the performanceof electro-optic seekers and their components. The basic tests which need to be performed are reviewed, with special emphasis on those for imaging seekers. New developments in seeker technology have required a re-assessment of the standard tests, and some novel methods are proposed. Homing devices, Infrared tracking, Imaging techniques.

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