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Specific Contact Resistance Extraction from Four-Point-Probe Measurements onMultilayered Film Structures

机译：多层薄膜结构四点探针测量的特定接触电阻提取

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作者
Vu, Q. T.; Kolawa, E.; Halperin, L.; Nicolet, M.-A.;
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年度 1991
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总页数 6
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
Very large scale integration; Films; Reprints;

机译：非常大规模的集成;电影;重印;

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1. Specific contact resistance measurements of the screen-printed Ag thick film contacts in the silicon solar cells by three-point probe methodology and TLM method [J] . P. N. Vinod Journal of materials science . 2011,第9期

机译：通过三点探针法和TLM方法测量硅太阳能电池中丝网印刷的Ag厚膜触点的比接触电阻
2. Specific contact resistance measurements of the screen-printed Ag thick film contacts in the silicon solar cells by three-point probe methodology and TLM method [J] . P. N. Vinod Journal of Materials Science: Materials in Electronics . 2011,第9期

机译：通过三点探针法和TLM方法测量硅太阳能电池中丝网印刷的Ag厚膜触点的比接触电阻
3. Measurement of the metal-semiconductor contact resistance and control of the specific resistance of semiconductor films [J] . V. V. Filippov, P. V. Frolov, N. N. Polyakov Russian physics journal . 2003,第7期

机译：金属-半导体接触电阻的测量和半导体膜的比电阻的控制
4. The formation of low resistance Ohmic contacts to 4H-SiC, circumventing the need for post annealing, studied by specific contact resistance measurements and X-ray photoelectron spectroscopy [C] . O.J. Guy, G. Pope, I. Blackwood, International Conference on Silicon Carbide and Related Materials 2003 pt.2(ICSCRM 2003); 20031005-20031010; Lyon; FR . 2003

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5. Analysis of non-contact and contact probe-to-sample thermal exchange for quantitative measurements of thin film and nanostructure thermal conductivity by the scanning hot probe method. [D] . Wilson, Adam A. 2017

机译：通过扫描热探针法对非接触式和接触式探针与样品之间的热交换进行分析，以定量测量薄膜和纳米结构的热导率。
6. Association Between Biofilm Formation Structure and the Expression Levels of Genes Related to biofilm formation and Biofilm-Specific Resistance of Acinetobacter baumannii Strains Isolated from Burn Infection in Ahvaz Iran [O] . Mansour Amin, Tahereh Navidifar, Farkhondeh Saleh Shooshtari, 2019

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7. Evaluation of Transmission Line Model Structures for Silicide-to-Silicon Specific Contact Resistance Extraction [O] . Stavitski, N., van Dal, Mark J.H., Lauwers, Anne, 2008

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8. Specific Contact Resistance Measurements of Ohmic Contacts to SemiconductingDiamond [R] . Hewett, C. A., Taylor, M. J., Zeidler, J. R., 1995

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Specific Contact Resistance Extraction from Four-Point-Probe Measurements onMultilayered Film Structures

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