Diffraction Determination of the Structure of Metastable Three-DimensionalCrystals of Ge Grown on Si(001)

摘要

A straightforward kinematic analysis of diffraction from metastable three-dimensional crystallites of Ge grown on Si(001) is presented. Low-energy electron diffraction data from these crystallites are shown to agree with diffraction images calculated for a structure determined from scanning-tunneling microscopy data. Additionally, reflection high-energy electron diffraction images predicted for these crystals agree with existing data.