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Electronics Reliability Fracture Mechanics, Volume 1. Causes of Failures of ShopReplaceable Units and Hybrid Microcircuits

机译:电子可靠性断裂力学,第1卷。车间可替换单元和混合微电路的故障原因

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This is the first of two volumes. The other volume (WL-TR-91-3119) is 'FractureMechanics.' The objective of the Electronics Reliability Fracture Mechanics (ERFM) program was to develop and demonstrate a life prediction technique for electronic assemblies, when subjected to environmental stress of vibration and thermal cycling, based upon the mechanical properties of the materials and packaging configurations which make up an electronic system. A detailed investigation was performed of the following two shop replaceable units (SRUs): Timing and Control Module (P/N 3562102) and Linear Regulator Module (P/N 3569800). The SRUs are in the Programmable Signal Processor (3137042) Line Replaceable Unit (LRU) of the Hughes AN/APG-63 Radar for the F-15 Aircraft.

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