Assessment of COMSCAN, a Compton Backscatter Imaging Camera, for the One-SidedNon-Destructive Inspection of Aerospace Components

摘要

This report presents some results obtained using a Compton backscatter imagingcamera, developed by Philips Industries, which were obtained during a visit to the Defense Research Establishment Pacific (DREP) during May/June 1992. Compton backscatter imaging is an X-ray technique which can be used to non-destructively inspect the interior of both metallic and non-metallic structures and, unlike conventional X-ray methods, requires access to only one side of the part being inspected. Aircraft components, Cameras, Spacecraft components, Compton effect. Nondestructive tests, X Ray inspection.