High Brightness Cathodes for Microfocus X-Ray Generators

摘要

Nondestructive inspection techniques such as Computed Tomography (CT) andBackscatter Imaging Tomography (BIT) have advanced to the point where detectors and image processors have reached a plateau in performance. Further improvement in the inspection techniques must come from better X-ray sources. Microfocus X-ray sources offer this improved performance due to their small X-ray spot size, which is generally on the order of tens of micrometers. The small spot approximates a point source, which reduces geometric distortions of the image. The sources currently available, however, frequently do not meet industrial user maintenance and ease-of-use standards, especially with regard to beam stability and electron emitter lifetime. By using new emitter materials, careful electron gun design, and proper high-vacuum construction techniques, we have developed a high-energy (360 keV), low-maintenance microfocus X-ray source with the improved performance required to meet these demands. X-Ray sources, Computed tomography, 360 keV Microfocus x-ray.